Characterization

Session Chairs: Kate Ziemer, Northeastern University, and Karen Kavanagh, Simon Fraser University

Achieving controlled synthesis of functional nanostructures, developing growth processes for defect-free wide bandgap substrates, and effectively integrating different functional materials are some of the challenges to be overcome in developing the next generation of materials and devices. Critical capabilities necessary to help meet these challenges are the characterization of structural, chemical, and functional (electrical, magnetic, etc.) properties of nanostructures, thin films, bulk materials, and interfaces. This session highlights state-of-the-art in-situ and ex-situ characterization techniques applicable to the growth of thin films and nanostructures, as well as the defect and property characterization of bulk materials. Contributions discussing novel in-situ techniques used to understand the growth mechanisms of films, bulk material, and/or nanostructures with wide applications to the crystal growing community are especially encouraged.

Invited Speakers:

Sylvie Morin, York University
Robert Marzke, Arizona State University